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Metallic Nanogaps for Rapid Screening of Electrical Properties of Nanoscale Particles

 ;  ;

2006

IEEE EDS Workshops on Advanced Electron Devices
Seminar, Duisburg, GermanyDuisburg, Germany, 13 Jun 20062006-06-13


Note: Record converted from VDB: 12.11.2012
Contributing Institute(s):
  1. Elektronische Materialien (IFF-IEM)
  2. Center of Nanoelectronic Systems for Information Technology (CNI)
Research Program(s):
  1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2006
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Document types > Presentations > Poster
Institute Collections > PGI > PGI-7
Workflow collections > Public records
Publications database
 Record created 2012-11-13, last modified 2018-02-11
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