Konferenzvorträge

Total internal reflection microscopy (TIRM) has been used for about 30 years to measure interaction potentials between suspended spherical colloids and flat surfaces. The method also allows measuring position resolved dynamic properties, specifically the diffusion coefficient and the drift velocity normal to the surface. [...]

We have studied sub-100nm-scale nanobridge Josephson junctions (nJJs) and nJJ-based circuits using microstructural analysis and measurements of electron transport properties to reveal the possible origins of a spread in superconducting parameters (Tc, Ic, etc.) and long-term stability. The structures were prepared by dc magnetron sputtering from Nb, Ti and TiN targets, with electron beam exposure of HSQ resist and reactive ion etching in pure SF6 gas. [...]