Vita Publications

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2018-10-30
15:40
[FZJ-2018-06202] Talk (non-conference)
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Measurement of 002 structure factors for GaAs using parallel and convergent beam electron diffraction
Meeting of the Arbeitskreises Hochaufl¨osende Elektronenmikroskopie, BremenBremen, Germany, 23 Apr 2008 - 23 Apr 20082008-04-232008-04-23

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2018-10-30
15:25
[FZJ-2018-06200] Poster
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Measurement of GaAs structure factors from the diffraction of parallel and convergent electron nanoprobes
EMC 2008, AachenAachen, Germany, 1 Sep 2008 - 5 Sep 20082008-09-012008-09-05

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2018-10-30
15:06
[FZJ-2018-06198] Talk (non-conference)
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Measurement of 002 structure factors for GaAs from electron spot diffraction patterns
Verhandlungen der DPG [Talk]. HL 33.2. 2008, p. 376., BerlinBerlin, Germany, 25 Feb 2008 - 29 Feb 20082008-02-252008-02-29

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2018-10-30
15:04
[FZJ-2018-06197] Talk (non-conference)
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Advanced Methods in Transmission Electron Microscopy
Tutorial held at the workshop of the Institute for solid state physics in Riezlern, Austria, AustriaAustria,

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2018-10-30
14:53
[FZJ-2018-06195] Poster
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Simultaneous measurement of In and N concentration maps and profiles in InGaNAs from a single TEM lattice fringe image
MC2009, GrazGraz, Austria, 30 Aug 2009 - 4 Sep 20092009-08-302009-09-04

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2018-10-30
14:17
[FZJ-2018-06192] Poster
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Ab initio based atomic scattering amplitudes and 002 electron structure factor of GaInAsN / GaAs Quantum wells
32nd International Symposium on Dynamical Properties of Solidsþw, AntwerpAntwerp, Belgium, 13 Sep 2009 - 17 Sep 20092009-09-132009-09-17

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2018-10-30
14:15
[FZJ-2018-06191] Conference Presentation (Invited)
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Analysis of semiconductor interfaces and surface segregation using the composition evaluation by lattice fringe analyis (CELFA) method
Physics at surfaces and Interfaces (PSI), PuriPuri, India, 23 Mar 2009 - 27 Mar 20092009-03-232009-03-27

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2018-10-30
14:05
[FZJ-2018-06190] Poster
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Measurement of structure factors by parallel and convergent beam electron nanodiffraction
MC2009, GrazGraz, Austria, 30 Aug 2009 - 4 Sep 20092009-08-302009-09-04

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2018-10-30
13:58
[FZJ-2018-06189] Talk (non-conference) (Panel discussion)
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Analysis of segregation profiles in InGaAs quantum wells via TEM and STEM
Verhandlungen der DPG HL, BerlinBerlin, Germany, 1 Jun 2009 - 1 Jun 20092009-06-012009-06-01

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2018-10-30
13:54
[FZJ-2018-06188] Journal Article/Contribution to a conference proceedings
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Towards a quantitative concentration analysis in InGaAs-heterostructures using HAADF-STEM
MC2009, GrazGraz, Austria, 30 Aug 2009 - 4 Sep 20092009-08-302009-09-04 219 - 220 ()

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