Vita Publications

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2018-09-20
14:50
[FZJ-2018-05422] Conference Presentation (Invited)
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Measurement of composition and strain by STEM
Microscopy and Microanalysis, PhoenixPhoenix, USA, 29 Jul 2012 - 2 Aug 20122012-07-292012-08-02 () [10.1017/S1431927612010872]
ddc:570
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2018-09-20
14:46
[FZJ-2018-05421] Conference Presentation (Invited)
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Measurement of composition and strain in InGaN quantum dotsby STEM
The XXXIII Annual Meeting of the Electron Microscopy Society of, BegaluruBegaluru, India, 4 Jul 2012 - 4 Jul 20122012-07-042012-07-04

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2018-09-20
14:40
[FZJ-2018-05420] Conference Presentation (Invited)
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Measurement of Composition and Strain by Scanning Transmission Electron Microscopy
Micrsocopy and Microanalysis, PhoenixPhoenix, USA, 29 Jul 2012 - 2 Aug 20122012-07-292012-08-02

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2018-09-20
14:36
[FZJ-2018-05419] Conference Presentation (Invited)
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Measurement of Composition and Strain by STEM
International Conference on Extended Defects in Semiconductors, ThessalonikiThessaloniki, Greece, 24 Jun 2012 - 29 Jun 20122012-06-242012-06-29

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2018-09-20
14:31
[FZJ-2018-05417] Conference Presentation
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TEM investigation of InGaN quantum dots
First German-Korean Symposium on Nano-optics and Nano-technology, DelmenhorstDelmenhorst, Germany, 14 Dec 2012 - 14 Dec 20122012-12-142012-12-14

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2018-09-17
16:52
[FZJ-2018-05361] Conference Presentation (Invited)
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TEM investigation of InGaN quantum dots
First German-Korean Symposium on Nano-optics and Nano-technology, DelmenhorstDelmenhorst, Germany, 14 Dec 2012 - 14 Dec 20122012-12-142012-12-14

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2018-09-17
16:34
[FZJ-2018-05359] Talk (non-conference) (Other)
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Strain measurement in semiconductor nanostructures by convergent electron nanoprobe diffraction
Verhandlungen der Deutschen Physikalischen Gesellschaft, Meeting location, 17 Sep 2012 - 17 Sep 20122012-09-172012-09-17

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2018-09-17
16:28
[FZJ-2018-05358] Conference Presentation (Invited)
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Strain Analysis by nano-beam electron diffraction (SANBED) in semiconductor nanostructures
The XXXIII Annual Meeting of the Electron Microscopy Society of India, BangaloreBangalore, India, 2 Jul 2012 - 4 Jul 20122012-07-022012-07-04

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2018-09-17
16:25
[FZJ-2018-05357] Poster
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Chemical Analysis of InGaNAs Quantum wells using HAADF STEM
EMC , ManchesterManchester, UK, 16 Sep 2012 - 21 Sep 20122012-09-162012-09-21

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2018-09-17
16:09
[FZJ-2018-05356] Poster
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A new method for true 2d chemical mapping: strain-field unaffected Evaluation of dilute GaNAs by HAADF STEM
Microscopy and Microanalysis (M&M), PhoenixPhoenix, USA, 29 Jul 2012 - 2 Aug 20122012-07-292012-08-02

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