Reliability of Computing-In-Memory Concepts Based on Memristive Arrays

Wouters, D. J.; Tahoori, M.; Brackmann, L.; Waser, R.; Jafari, A.; Menzel, S.; Mayahinia, M.; Bengel, C.

doi:10.1109/IEDM45625.2022.10019423

Contribution to a conference proceedings/Contribution to a book

FZJ-2023-01393

Reliability of Computing-In-Memory Concepts Based on Memristive Arrays

Wouters, D. J. ; Brackmann, L. ; Jafari, A. ; Bengel, C.FZJ* ; Mayahinia, M. ; Waser, R.FZJ* ; Menzel, S. ; Tahoori, M.

2022
IEEE

2022 International Electron Devices Meeting (IEDM) : [Proceedings] - IEEE, 2022. - ISBN 978-1-6654-8959-1 - doi:10.1109/IEDM45625.2022.10019423
2022 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, 3 Dec 2022 - 7 Dec 2022 IEEE 102 pp. (2022) [10.1109/IEDM45625.2022.10019423]

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Record created 2023-03-06, last modified 2024-02-26

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