% IMPORTANT: The following is UTF-8 encoded. This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.
@ARTICLE{Yu:1005303,
author = {Yu, Yuan and Wuttig, Matthias},
title = {{M}etavalent bonding impacts charge carrier transport
across grain boundaries},
journal = {Nano research energy},
volume = {2},
issn = {2791-0091},
address = {Beijing},
publisher = {Tsinghua University Press},
reportid = {FZJ-2023-01415},
pages = {e9120057 -},
year = {2023},
abstract = {Understanding the mechanisms underpinning the charge
carrier scattering at grain boundaries is crucial to design
thermoelectrics and other electronic materials. Yet, this is
a very challenging task due to the complex characteristics
of grain boundaries and the resulting difficulties in
correlating grain boundary structures to local properties.
Recent advances in characterizing charge transport across
grain boundaries are reviewed, demonstrating how the
microstructure, composition, chemical bonding and electrical
properties of the same individual grain boundary can be
correlated. A much higher potential barrier height is
observed in high-angle grain boundaries. This can be
ascribed to the larger number density of deep trapping
states caused by the local collapse of metavalent bonding. A
novel approach to study the influence of the local chemical
bonding mechanism around defects on the resulting local
properties is thus developed. The results provide insights
into the tailoring of electronic properties of metavalently
bonded compounds by engineering the characteristics of grain
boundaries.},
cin = {PGI-10},
ddc = {333.7},
cid = {I:(DE-Juel1)PGI-10-20170113},
pnm = {5233 - Memristive Materials and Devices (POF4-523)},
pid = {G:(DE-HGF)POF4-5233},
typ = {PUB:(DE-HGF)16},
UT = {WOS:001494133100001},
doi = {10.26599/NRE.2023.9120057},
url = {https://juser.fz-juelich.de/record/1005303},
}