% IMPORTANT: The following is UTF-8 encoded. This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.
@ARTICLE{Hartnagel:1005331,
author = {Hartnagel, Paula and Ravi Shankar, Sandheep and Klingebiel,
Benjamin and Thimm, Oliver and Kirchartz, Thomas},
title = {{C}omparing {M}ethods of {C}haracterizing {E}nergetic
{D}isorder in {O}rganic {S}olar {C}ells},
journal = {Advanced energy materials},
volume = {13},
number = {15},
issn = {1614-6832},
address = {Weinheim},
publisher = {Wiley-VCH},
reportid = {FZJ-2023-01440},
pages = {2300329},
year = {2023},
abstract = {The energetic disorder has been known for decades to limit
the performance of structurally disordered semiconductors
such as amorphous silicon and organic semiconductors.
However, in the past years, high-performance organic solar
cells have emerged showing a continuously reduced amount of
energetic disorder. While searching for future
high-efficiency material systems, it is therefore important
to correctly characterize this energetic disorder. While
there are several techniques in the literature, the most
common approaches to probe the density of defect states are
using optical excitation as in external quantum efficiency
measurements, or sequential filling of the tail states by
applying an external voltage as in admittance spectroscopy.
A metanalysis of available literature, as well as the
experiments using four characterization techniques on two
material systems, reveal that electrical, voltage-dependent
measurements frequently yield higher values of energetic
disorder than optical measurements. With drift-diffusion
simulations, it is demonstrated that the approaches probe
different energy ranges of the subband-gap density of
states. The limitations of the techniques are further
explored and it is found that extraction of information from
a capacitance-voltage curve can be inhibited by internal
series resistance. Thereby, the discrepancies between
measurement techniques with sensitivity to different energy
ranges and electronic parameters are explained.},
cin = {IEK-5},
ddc = {050},
cid = {I:(DE-Juel1)IEK-5-20101013},
pnm = {1215 - Simulations, Theory, Optics, and Analytics (STOA)
(POF4-121)},
pid = {G:(DE-HGF)POF4-1215},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000941150600001},
doi = {10.1002/aenm.202300329},
url = {https://juser.fz-juelich.de/record/1005331},
}