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@INPROCEEDINGS{Stellhorn:1005523,
      author       = {Stellhorn, Annika and Blackburn, E. and Kentzinger,
                      Emmanuel and Shen, L. and Lee, W. T.},
      title        = {{P}olarized {SANS} $\&$ {GISANS} studies on condensed
                      matter systems},
      reportid     = {FZJ-2023-01523},
      year         = {2023},
      abstract     = {Small-Angle-Neutron-Scattering (SANS) and
                      Grazing-Incidence-SANS (GISANS) techniques have seen a
                      remarkable growth in their application in studies of
                      magnetic materials. In combination with neutron polarization
                      analysis, SANS and GISANS offer magnetic vector analysis on
                      the micro- and mesoscopic length scale with high signal to
                      noise ratio. However, in multiple sample environments like
                      applied magnetic and electric field and at low temperatures,
                      the experimental setup and data analysis procedures remain
                      open issues.Two examples are presented here. Firstly,
                      magnetic chiral domain walls in thin-film heterostructures
                      of Nb/FePd [1] have been investigated using GISANS with
                      polarization analysis in an applied magnetic field and at
                      low temperature. Optimizing the neutron-spin transport for
                      low magnetic guide fields and its impact on the data
                      analysis using in-house developed tools will be discussed.
                      Secondly, magnetic chiral phases occurring in the
                      magnetoelectric single crystal $Ba_{2-x}Sr_xMg_2Fe_12O_22$
                      [2] are studied using SANS with polarization analysis in
                      applied magnetic and electric fields at low temperatures.
                      Considerations in the instrumental design and the SANS data
                      analysis using the SasView software [3] will be reported.
                      Polarization analysis has been incorporated as an integral
                      part of the ESS instrument suite [4]. An introduction of its
                      current scope will be provided. [1] A. Stellhorn et al., New
                      Journal of Physics 22, 093001 (2020).[2] K. Zhai et al.,
                      Nature Communications 8, 519 (2017).[3] www.sasview.org[4]
                      W. T. Lee et. al., Report on ESS Polarisation Workshop,
                      ESS-3549713 (2020).},
      month         = {Mar},
      date          = {2023-03-19},
      organization  = {Eighth European Conference on Neutron
                       Scattering, TUM Department of
                       Mechanical Engineering and the new
                       Science Congress Center Munich
                       (Germany), 19 Mar 2023 - 23 Mar 2023},
      subtyp        = {Invited},
      cin          = {JCNS-2 / PGI-4 / JARA-FIT},
      cid          = {I:(DE-Juel1)JCNS-2-20110106 / I:(DE-Juel1)PGI-4-20110106 /
                      $I:(DE-82)080009_20140620$},
      pnm          = {632 - Materials – Quantum, Complex and Functional
                      Materials (POF4-632) / 6G4 - Jülich Centre for Neutron
                      Research (JCNS) (FZJ) (POF4-6G4)},
      pid          = {G:(DE-HGF)POF4-632 / G:(DE-HGF)POF4-6G4},
      typ          = {PUB:(DE-HGF)24},
      url          = {https://juser.fz-juelich.de/record/1005523},
}