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@ARTICLE{Strauch:1006639,
      author       = {Strauch, Achim and März, Benjamin and Denneulin, Thibaud
                      and Cattaneo, Mauricio and Rosenauer, Andreas and
                      Müller-Caspary, Knut},
      title        = {{S}ystematic {E}rrors of {E}lectric {F}ield {M}easurements
                      in {F}erroelectrics by {U}nit {C}ell {A}veraged {M}omentum
                      {T}ransfers in {STEM}},
      journal      = {Microscopy and microanalysis},
      volume       = {29},
      number       = {2},
      issn         = {1079-8501},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2023-01772},
      pages        = {499 - 511},
      year         = {2023},
      abstract     = {When using the unit cell average of first moment data from
                      four-dimensional scanning transmission electron microscopy
                      (4D-STEM) to characterize ferroelectric materials, a variety
                      of sources of systematic errors needs to be taken into
                      account. In particular, these are the magnitude of the
                      acceleration voltage, STEM probe semi-convergence angle,
                      sample thickness, and sample tilt out of zone axis.
                      Simulations show that a systematic error of calculated
                      electric fields using the unit cell averaged momentum
                      transfer originates from violation of point symmetry within
                      the unit cells. Thus, values can easily exceed those of
                      potential polarization-induced electric fields in
                      ferroelectrics. Importantly, this systematic error produces
                      deflection gradients between different domains seemingly
                      representing measured fields. However, it could be shown
                      that for PbZr0.2Ti0.8O3, many adjacent domains exhibit a
                      relative crystallographic mistilt and in-plane rotation. The
                      experimental results show that the method gives qualitative
                      domain contrast. Comparison of the calculated electric field
                      with the systematic error showed that the domain contrast of
                      the unit cell averaged electric fields is mainly caused by
                      dynamical scattering effects and the electric field plays
                      only a minor role, if present at all.},
      cin          = {ER-C-1},
      ddc          = {500},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {5351 - Platform for Correlative, In Situ and Operando
                      Characterization (POF4-535) / moreSTEM - Momentum-resolved
                      Scanning Transmission Electron Microscopy (VH-NG-1317) /
                      Ptychography 4.0 - Proposal for a pilot project "Information
                      $\&$ Data Science" (ZT-I-0025)},
      pid          = {G:(DE-HGF)POF4-5351 / G:(DE-HGF)VH-NG-1317 /
                      G:(DE-HGF)ZT-I-0025},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000984270700007},
      doi          = {10.1093/micmic/ozad016},
      url          = {https://juser.fz-juelich.de/record/1006639},
}