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001006766 1001_ $$00000-0002-0853-9882$$aZinßer, Mario$$b0$$eCorresponding author
001006766 245__ $$aHolistic yield modeling, top-down loss analysis, and efficiency potential study of thin-film solar modules
001006766 260__ $$aLondon$$bSpringer Nature$$c2023
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001006766 520__ $$aA holistic simulation of a photovoltaic system requires multiple physical levels - the optoelectronic behavior of the semiconductor devices, the conduction of the generated current, and the actual operating conditions, which rarely correspond to the standard testing conditions (STC) employed in product qualification. We present a holistic simulation approach for all thin-film photovoltaic module technologies that includes a transfer-matrix method, a drift-diffusion model to account for the p-n junction, and a quasi-three-dimensional finite-element Poisson solver to consider electrical transport. The evolved digital model enables bidirectional calculation from material parameters to non-STC energy yield and vice versa, as well as accurate predictions of module behavior, time-dependent top-down loss analyses and bottom-up sensitivity analyses. Simple input data like current-voltage curves and material parameters of semiconducting and transport layers enables fitting of otherwise less-defined values. The simulation is valuable for effective optimizations, but also for revealing values for difficult-to-measure parameters.
001006766 536__ $$0G:(DE-HGF)POF4-1215$$a1215 - Simulations, Theory, Optics, and Analytics (STOA) (POF4-121)$$cPOF4-121$$fPOF IV$$x0
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001006766 7001_ $$00000-0002-9213-7623$$aHelder, Tim$$b1
001006766 7001_ $$00000-0001-7506-8390$$aMagorian Friedlmeier, Theresa$$b2
001006766 7001_ $$aBauer, Andreas$$b3
001006766 7001_ $$0P:(DE-Juel1)159457$$aKirchartz, Thomas$$b4
001006766 7001_ $$aRau, Uwe$$b5
001006766 7001_ $$aWächter, Rolf$$b6
001006766 7001_ $$0P:(DE-HGF)0$$aPowalla, Michael$$b7
001006766 773__ $$0PERI:(DE-600)2921913-9$$a10.1038/s42005-023-01164-6$$gVol. 6, no. 1, p. 55$$n1$$p55$$tCommunications Physics$$v6$$x2399-3650$$y2023
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