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@ARTICLE{Ziner:1006766,
      author       = {Zinßer, Mario and Helder, Tim and Magorian Friedlmeier,
                      Theresa and Bauer, Andreas and Kirchartz, Thomas and Rau,
                      Uwe and Wächter, Rolf and Powalla, Michael},
      title        = {{H}olistic yield modeling, top-down loss analysis, and
                      efficiency potential study of thin-film solar modules},
      journal      = {Communications Physics},
      volume       = {6},
      number       = {1},
      issn         = {2399-3650},
      address      = {London},
      publisher    = {Springer Nature},
      reportid     = {FZJ-2023-01824},
      pages        = {55},
      year         = {2023},
      abstract     = {A holistic simulation of a photovoltaic system requires
                      multiple physical levels - the optoelectronic behavior of
                      the semiconductor devices, the conduction of the generated
                      current, and the actual operating conditions, which rarely
                      correspond to the standard testing conditions (STC) employed
                      in product qualification. We present a holistic simulation
                      approach for all thin-film photovoltaic module technologies
                      that includes a transfer-matrix method, a drift-diffusion
                      model to account for the p-n junction, and a
                      quasi-three-dimensional finite-element Poisson solver to
                      consider electrical transport. The evolved digital model
                      enables bidirectional calculation from material parameters
                      to non-STC energy yield and vice versa, as well as accurate
                      predictions of module behavior, time-dependent top-down loss
                      analyses and bottom-up sensitivity analyses. Simple input
                      data like current-voltage curves and material parameters of
                      semiconducting and transport layers enables fitting of
                      otherwise less-defined values. The simulation is valuable
                      for effective optimizations, but also for revealing values
                      for difficult-to-measure parameters.},
      cin          = {IEK-5},
      ddc          = {530},
      cid          = {I:(DE-Juel1)IEK-5-20101013},
      pnm          = {1215 - Simulations, Theory, Optics, and Analytics (STOA)
                      (POF4-121)},
      pid          = {G:(DE-HGF)POF4-1215},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000957592000001},
      doi          = {10.1038/s42005-023-01164-6},
      url          = {https://juser.fz-juelich.de/record/1006766},
}