Home > Publications database > High peak hardness in Al-Ni multilayer thin films originates from intermetallic interface contributions > RIS |
TY - CONF AU - Peter, Nicolas AU - Li, Xi AU - Moreira de Lima, Marilaine AU - Schwaiger, Ruth TI - High peak hardness in Al-Ni multilayer thin films originates from intermetallic interface contributions M1 - FZJ-2023-01859 PY - 2023 T2 - TMS 2023 CY - 19 Mar 2023 - 23 Mar 2023, San Diego (USA) Y2 - 19 Mar 2023 - 23 Mar 2023 M2 - San Diego, USA LB - PUB:(DE-HGF)6 UR - https://juser.fz-juelich.de/record/1006806 ER -