Home > Publications database > Study on Single Event Effect (SEE) on electronic devices on board
 
Talk (non-conference) (Invited) FZJ-2023-01885
http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png
Study on Single Event Effect (SEE) on electronic devices on board



2023

JCNS-2 POF V Klausur, GSI BonnGSI Bonn, Germany, 24 Apr 2023 - 25 Apr 20232023-04-242023-04-25

Contributing Institute(s):
  1. Streumethoden (JCNS-2)
  2. Streumethoden (PGI-4)
  3. High Brilliance Source (JCNS-HBS)
  4. JARA-FIT (JARA-FIT)
Research Program(s):
  1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)
  2. 6G4 - Jülich Centre for Neutron Research (JCNS) (FZJ) (POF4-6G4) (POF4-6G4)

Appears in the scientific report 2023
Click to display QR Code for this record

The record appears in these collections:
Document types > Presentations > Talks (non-conference)
Institute Collections > JCNS > JCNS-HBS
Institute Collections > JCNS > JCNS-2
JARA > JARA > JARA-JARA\-FIT
Institute Collections > PGI > PGI-4
Workflow collections > Public records
Publications database
 Record created 2023-04-18, last modified 2024-05-29
Similar records



Rate this document:

Rate this document:
1
2
3
4
5
 
(Not yet reviewed)
JuSER :: Search :: Submit :: Personalize :: Help
Powered by Invenio v1.1.7 | join2_v2510-2-gd5e4e3e
Maintained by juser@fz-juelich.de

Impressum | Data Privacy Policy
This site is also available in the following languages:
Deutsch  English