Home > Publications database > Modeling of ReRAMs based on the Valence Change Mechanism: From Atomistic to Circuit-Level Models > RIS |
TY - CONF AU - Menzel, Stephan TI - Modeling of ReRAMs based on the Valence Change Mechanism: From Atomistic to Circuit-Level Models M1 - FZJ-2023-02221 PY - 2023 T2 - IEEE 15th International Memory Workshop CY - 21 May 2023 - 24 May 2023, Monterey (USA) Y2 - 21 May 2023 - 24 May 2023 M2 - Monterey, USA LB - PUB:(DE-HGF)6 UR - https://juser.fz-juelich.de/record/1007859 ER -