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@ARTICLE{Landers:1008402,
author = {Landers, David and Clancy, Ian and Dunin-Borkowski, Rafal
E. and Weber, Dieter and Stewart, Andrew A.},
title = {{TEMGYM} {A}dvanced – {N}ano{M}i lens characterisation},
journal = {Micron},
volume = {169},
issn = {0047-7206},
address = {New York, NY [u.a.]},
publisher = {Elsevier},
reportid = {FZJ-2023-02328},
pages = {103450 -},
year = {2023},
abstract = {A complete analysis including finite element method (FEM)
calculation, focal length properties, and thirdorder
geometric aberrations of the open-source electrostatic lens
from the NanoMi project is presented. The analysis is
carried out by the software TEMGYM Advanced, a free package
developed to carry out ray-tracing and lens characterisation
in Python. Previously TEMGYM Advanced has shown how to
analyse the aberrations of analytical lens fields; this
paper expands upon this work to demonstrate how to apply a
suitable fitting method to discrete lens fields obtained via
FEM methods so that the aberrations of real lens designs can
be calculated. Each software platform used in this paper is
freely available in the community and creates a free and
viable alternative to commercial lens design packages.},
cin = {ER-C-1},
ddc = {570},
cid = {I:(DE-Juel1)ER-C-1-20170209},
pnm = {5351 - Platform for Correlative, In Situ and Operando
Characterization (POF4-535)},
pid = {G:(DE-HGF)POF4-5351},
typ = {PUB:(DE-HGF)16},
pubmed = {37030084},
UT = {WOS:000976676000001},
doi = {10.1016/j.micron.2023.103450},
url = {https://juser.fz-juelich.de/record/1008402},
}