%0 Journal Article
%A Wiefels, Stefan
%A Kopperberg, Nils
%A Hofmann, K.
%A Otterstedt, Jan
%A Wouters, Dirk
%A Waser, R.
%A Menzel, Stephan
%T Reliability Aspects of 28 nm BEOL-Integrated Resistive Switching Random Access Memory
%J Physica status solidi / A
%V 221
%N 22
%@ 1862-6300
%C Weinheim
%I Wiley-VCH
%M FZJ-2023-03952
%P 202300401
%D 2024
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:001094269400001
%R 10.1002/pssa.202300401
%U https://juser.fz-juelich.de/record/1017131