TY  - JOUR
AU  - Wiefels, Stefan
AU  - Kopperberg, Nils
AU  - Hofmann, K.
AU  - Otterstedt, Jan
AU  - Wouters, Dirk
AU  - Waser, R.
AU  - Menzel, Stephan
TI  - Reliability Aspects of 28 nm BEOL-Integrated Resistive Switching Random Access Memory
JO  - Physica status solidi / A
VL  - 221
IS  - 22
SN  - 1862-6300
CY  - Weinheim
PB  - Wiley-VCH
M1  - FZJ-2023-03952
SP  - 202300401
PY  - 2024
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001094269400001
DO  - DOI:10.1002/pssa.202300401
UR  - https://juser.fz-juelich.de/record/1017131
ER  -