TY  - JOUR
AU  - Zhang, Difei
AU  - Liu, Chao
AU  - Zhang, Kaicheng
AU  - Jia, Yanhua
AU  - Zhong, Wenkai
AU  - Qiu, Weidong
AU  - Li, Yuanfeng
AU  - Heumüller, Thomas
AU  - Forberich, Karen
AU  - Le Corre, Vincent M.
AU  - Lüer, Larry
AU  - Li, Ning
AU  - Huang, Fei
AU  - Brabec, Christoph
AU  - Ying, Lei
TI  - Observation of reversible light degradation in organic photovoltaics induced by long-persistent radicals
JO  - Energy & environmental science
VL  - 16
IS  - 11
SN  - 1754-5692
CY  - Cambridge
PB  - RSC Publ.
M1  - FZJ-2023-04044
SP  - 5339-5349 
PY  - 2023
AB  - With the rapid development of organic photovoltaics, device stability has become a crucial obstacle hindering their transition from laboratory-scale to industrial applications. However, it still remains unclear how light differs from heat in driving trap formation and device degradation. On the basis of the PTzBI-dF:Y6-BO system, it is observed that the post-thermal annealing on these high-performance organic solar cells can partially recover the light-induced burn-in losses. The recovery process is found to be correlated with a reversible charge extraction ability, reversible trap density of state, local charge carrier density and charge accumulation. Herein, we propose an innovative mechanism for light degradation in organic photovoltaic devices, which is triggered by the presence of light-induced long-persistent radicals. The findings offer deep insights into light degradation of organic photovoltaics and a new perspective for improving device stability under long-term operation.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001078917900001
DO  - DOI:10.1039/D3EE02540C
UR  - https://juser.fz-juelich.de/record/1017310
ER  -