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@ARTICLE{Zhang:1017310,
      author       = {Zhang, Difei and Liu, Chao and Zhang, Kaicheng and Jia,
                      Yanhua and Zhong, Wenkai and Qiu, Weidong and Li, Yuanfeng
                      and Heumüller, Thomas and Forberich, Karen and Le Corre,
                      Vincent M. and Lüer, Larry and Li, Ning and Huang, Fei and
                      Brabec, Christoph and Ying, Lei},
      title        = {{O}bservation of reversible light degradation in organic
                      photovoltaics induced by long-persistent radicals},
      journal      = {Energy $\&$ environmental science},
      volume       = {16},
      number       = {11},
      issn         = {1754-5692},
      address      = {Cambridge},
      publisher    = {RSC Publ.},
      reportid     = {FZJ-2023-04044},
      pages        = {5339-5349},
      year         = {2023},
      abstract     = {With the rapid development of organic photovoltaics, device
                      stability has become a crucial obstacle hindering their
                      transition from laboratory-scale to industrial applications.
                      However, it still remains unclear how light differs from
                      heat in driving trap formation and device degradation. On
                      the basis of the PTzBI-dF:Y6-BO system, it is observed that
                      the post-thermal annealing on these high-performance organic
                      solar cells can partially recover the light-induced burn-in
                      losses. The recovery process is found to be correlated with
                      a reversible charge extraction ability, reversible trap
                      density of state, local charge carrier density and charge
                      accumulation. Herein, we propose an innovative mechanism for
                      light degradation in organic photovoltaic devices, which is
                      triggered by the presence of light-induced long-persistent
                      radicals. The findings offer deep insights into light
                      degradation of organic photovoltaics and a new perspective
                      for improving device stability under long-term operation.},
      cin          = {IEK-11},
      ddc          = {690},
      cid          = {I:(DE-Juel1)IEK-11-20140314},
      pnm          = {1212 - Materials and Interfaces (POF4-121)},
      pid          = {G:(DE-HGF)POF4-1212},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:001078917900001},
      doi          = {10.1039/D3EE02540C},
      url          = {https://juser.fz-juelich.de/record/1017310},
}