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@ARTICLE{Ding:1017530,
      author       = {Ding, Ziming and Tang, Yushu and Chakravadhanula, Venkata
                      Sai Kiran and Ma, Qianli and Tietz, Frank and Dai, Yuting
                      and Scherer, Torsten and Kübel, Christian},
      title        = {{E}xploring the influence of focused ion beam processing
                      and scanning electron microscopy imaging on solid-state
                      electrolytes},
      journal      = {Microscopy},
      volume       = {72},
      number       = {4},
      issn         = {2050-5698},
      address      = {Tokyo},
      publisher    = {Oxford Univ. Press},
      reportid     = {FZJ-2023-04179},
      pages        = {326 - 335},
      year         = {2023},
      abstract     = {Performing reliable preparation of transmission electron
                      microscopy (TEM) samples is the necessary basis for a
                      meaningful investigation by ex situ and even more so by in
                      situ TEM techniques, but it is challenging using materials
                      that are sensitive to electron beam irradiation. Focused ion
                      beam is currently the most commonly employed technique for a
                      targeted preparation, but the structural modifications
                      induced during focused ion beam preparation are not fully
                      understood for a number of materials. Here, we have
                      investigated the impact of both the electron and the Ga+ ion
                      beam on insulating solid-state electrolytes (lithium
                      phosphorus oxynitride, Na-β"-alumina solid electrolyte and
                      Na3.4Si2.4Zr2P0.6O12 (NaSICON)) and observed significant
                      lithium/sodium whisker growth induced by both the electron
                      and ion beam already at fairly low dose, leading to a
                      significant change in the chemical composition. The metal
                      whisker growth is presumably mainly due to surface charging,
                      which can be reduced by coating with a gold layer or
                      preparation under cryogenic conditions as efficient
                      approaches to stabilize the solid electrolyte for scanning
                      electron microscopy imaging and TEM sample preparation.
                      Details on the different preparation approaches, the
                      acceleration voltage dependence and the induced chemical and
                      morphological changes are reported.},
      cin          = {IEK-1},
      ddc          = {530},
      cid          = {I:(DE-Juel1)IEK-1-20101013},
      pnm          = {1221 - Fundamentals and Materials (POF4-122)},
      pid          = {G:(DE-HGF)POF4-1221},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {36408996},
      UT           = {WOS:000898442800001},
      doi          = {10.1093/jmicro/dfac064},
      url          = {https://juser.fz-juelich.de/record/1017530},
}