%0 Journal Article
%A Corley-Wiciak, C.
%A Zoellner, M. H.
%A Zaitsev, I.
%A Anand, K.
%A Zatterin, E.
%A Yamamoto, Y.
%A Corley-Wiciak, A. A.
%A Reichmann, F.
%A Langheinrich, W.
%A Schreiber, Lars
%A Manganelli, C. L.
%A Virgilio, M.
%A Richter, Cornelia
%A Capellini, G.
%T Lattice Deformation at Submicron Scale: X-Ray Nanobeam Measurements of Elastic Strain in Electron Shuttling Devices
%J Physical review applied
%V 20
%N 2
%@ 2331-7019
%C College Park, Md. [u.a.]
%I American Physical Society
%M FZJ-2023-05616
%P 024056
%D 2023
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:001256508500001
%R 10.1103/PhysRevApplied.20.024056
%U https://juser.fz-juelich.de/record/1019785