TY  - JOUR
AU  - Corley-Wiciak, C.
AU  - Zoellner, M. H.
AU  - Zaitsev, I.
AU  - Anand, K.
AU  - Zatterin, E.
AU  - Yamamoto, Y.
AU  - Corley-Wiciak, A. A.
AU  - Reichmann, F.
AU  - Langheinrich, W.
AU  - Schreiber, Lars
AU  - Manganelli, C. L.
AU  - Virgilio, M.
AU  - Richter, Cornelia
AU  - Capellini, G.
TI  - Lattice Deformation at Submicron Scale: X-Ray Nanobeam Measurements of Elastic Strain in Electron Shuttling Devices
JO  - Physical review applied
VL  - 20
IS  - 2
SN  - 2331-7019
CY  - College Park, Md. [u.a.]
PB  - American Physical Society
M1  - FZJ-2023-05616
SP  - 024056
PY  - 2023
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001256508500001
DO  - DOI:10.1103/PhysRevApplied.20.024056
UR  - https://juser.fz-juelich.de/record/1019785
ER  -