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| 001 | 1019785 | ||
| 005 | 20240722100633.0 | ||
| 024 | 7 | _ | |a 10.1103/PhysRevApplied.20.024056 |2 doi |
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| 100 | 1 | _ | |a Corley-Wiciak, C. |0 0000-0002-0179-2957 |b 0 |e Corresponding author |
| 245 | _ | _ | |a Lattice Deformation at Submicron Scale: X-Ray Nanobeam Measurements of Elastic Strain in Electron Shuttling Devices |
| 260 | _ | _ | |a College Park, Md. [u.a.] |c 2023 |b American Physical Society |
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| 700 | 1 | _ | |a Zoellner, M. H. |0 0000-0001-7204-1096 |b 1 |
| 700 | 1 | _ | |a Zaitsev, I. |0 0009-0008-9848-8046 |b 2 |
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| 700 | 1 | _ | |a Capellini, G. |0 0000-0002-5169-2823 |b 13 |
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