%0 Electronic Article
%A Janßen, Kevin
%A Rüßmann, Philipp
%A Liberda, Sergej
%A Schleenvoigt, Michael
%A Hou, Xiao
%A Jalil, Abdur Rehman
%A Lentz, Florian
%A Trellenkamp, Stefan
%A Bennemann, Benjamin
%A Zimmermann, Erik
%A Mussler, Gregor
%A Schüffelgen, Peter
%A Schneider, Claus-Michael
%A Blügel, Stefan
%A Grützmacher, Detlev
%A Plucinski, Lukasz
%A Schäpers, Thomas
%T Single in situ Interface Characterization Composed of Niobium and a Selectively Grown (Bi$_{1-x}$Sb$_x$)$_2$Te$_3$ Topological Insulator Nanoribbon
%I arXiv
%M FZJ-2023-05763
%D 2023
%X With increasing attention in Majorana physics for possible quantum bit applications, a large interest has been developed to understand the properties of the interface between a $s$-type superconductor and a topological insulator. Up to this point the interface analysis was mainly focused on in situ prepared Josephson junctions, which consist of two coupled single interfaces or to ex-situ fabricated single interface devices. In our work we utilize a novel fabrication process, combining selective area growth and shadow evaporation which allows the characterization of a single in situ fabricated Nb/$\mathrm{(Bi_{0.15}Sb_{0.85})_2Te_3}$ nano interface. The resulting high interface transparency is apparent by a zero bias conductance increase by a factor of 1.7. Furthermore, we present a comprehensive differential conductance analysis of our single in situ interface for various magnetic fields, temperatures and gate voltages. Additionally, density functional theory calculations of the superconductor/topological insulator interface are performed in order to explain the peak-like shape of our differential conductance spectra and the origin of the observed smearing of conductance features.
%K Mesoscale and Nanoscale Physics (cond-mat.mes-hall) (Other)
%K FOS: Physical sciences (Other)
%F PUB:(DE-HGF)25
%9 Preprint
%R 10.48550/ARXIV.2312.07325
%U https://juser.fz-juelich.de/record/1019942