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001019942 1001_ $$0P:(DE-Juel1)177774$$aJanßen, Kevin$$b0
001019942 245__ $$aSingle in situ Interface Characterization Composed of Niobium and a Selectively Grown (Bi$_{1-x}$Sb$_x$)$_2$Te$_3$ Topological Insulator Nanoribbon
001019942 260__ $$barXiv$$c2023
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001019942 520__ $$aWith increasing attention in Majorana physics for possible quantum bit applications, a large interest has been developed to understand the properties of the interface between a $s$-type superconductor and a topological insulator. Up to this point the interface analysis was mainly focused on in situ prepared Josephson junctions, which consist of two coupled single interfaces or to ex-situ fabricated single interface devices. In our work we utilize a novel fabrication process, combining selective area growth and shadow evaporation which allows the characterization of a single in situ fabricated Nb/$\mathrm{(Bi_{0.15}Sb_{0.85})_2Te_3}$ nano interface. The resulting high interface transparency is apparent by a zero bias conductance increase by a factor of 1.7. Furthermore, we present a comprehensive differential conductance analysis of our single in situ interface for various magnetic fields, temperatures and gate voltages. Additionally, density functional theory calculations of the superconductor/topological insulator interface are performed in order to explain the peak-like shape of our differential conductance spectra and the origin of the observed smearing of conductance features.
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001019942 650_7 $$2Other$$aMesoscale and Nanoscale Physics (cond-mat.mes-hall)
001019942 650_7 $$2Other$$aFOS: Physical sciences
001019942 7001_ $$0P:(DE-Juel1)157882$$aRüßmann, Philipp$$b1$$ufzj
001019942 7001_ $$0P:(DE-Juel1)186768$$aLiberda, Sergej$$b2$$ufzj
001019942 7001_ $$0P:(DE-Juel1)171405$$aSchleenvoigt, Michael$$b3$$ufzj
001019942 7001_ $$0P:(DE-Juel1)165589$$aHou, Xiao$$b4$$ufzj
001019942 7001_ $$0P:(DE-Juel1)171826$$aJalil, Abdur Rehman$$b5$$ufzj
001019942 7001_ $$0P:(DE-Juel1)130795$$aLentz, Florian$$b6$$ufzj
001019942 7001_ $$0P:(DE-Juel1)128856$$aTrellenkamp, Stefan$$b7$$ufzj
001019942 7001_ $$0P:(DE-Juel1)161192$$aBennemann, Benjamin$$b8$$ufzj
001019942 7001_ $$0P:(DE-Juel1)176848$$aZimmermann, Erik$$b9
001019942 7001_ $$0P:(DE-Juel1)128617$$aMussler, Gregor$$b10$$ufzj
001019942 7001_ $$0P:(DE-Juel1)165984$$aSchüffelgen, Peter$$b11$$ufzj
001019942 7001_ $$0P:(DE-Juel1)130948$$aSchneider, Claus-Michael$$b12$$ufzj
001019942 7001_ $$0P:(DE-Juel1)130548$$aBlügel, Stefan$$b13$$ufzj
001019942 7001_ $$0P:(DE-Juel1)125588$$aGrützmacher, Detlev$$b14$$ufzj
001019942 7001_ $$0P:(DE-Juel1)130895$$aPlucinski, Lukasz$$b15$$ufzj
001019942 7001_ $$0P:(DE-Juel1)128634$$aSchäpers, Thomas$$b16$$eCorresponding author$$ufzj
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