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@ARTICLE{Janen:1019942,
      author       = {Janßen, Kevin and Rüßmann, Philipp and Liberda, Sergej
                      and Schleenvoigt, Michael and Hou, Xiao and Jalil, Abdur
                      Rehman and Lentz, Florian and Trellenkamp, Stefan and
                      Bennemann, Benjamin and Zimmermann, Erik and Mussler, Gregor
                      and Schüffelgen, Peter and Schneider, Claus-Michael and
                      Blügel, Stefan and Grützmacher, Detlev and Plucinski,
                      Lukasz and Schäpers, Thomas},
      title        = {{S}ingle in situ {I}nterface {C}haracterization {C}omposed
                      of {N}iobium and a {S}electively {G}rown
                      ({B}i$_{1-x}${S}b$_x$)$_2${T}e$_3$ {T}opological {I}nsulator
                      {N}anoribbon},
      publisher    = {arXiv},
      reportid     = {FZJ-2023-05763},
      year         = {2023},
      abstract     = {With increasing attention in Majorana physics for possible
                      quantum bit applications, a large interest has been
                      developed to understand the properties of the interface
                      between a $s$-type superconductor and a topological
                      insulator. Up to this point the interface analysis was
                      mainly focused on in situ prepared Josephson junctions,
                      which consist of two coupled single interfaces or to ex-situ
                      fabricated single interface devices. In our work we utilize
                      a novel fabrication process, combining selective area growth
                      and shadow evaporation which allows the characterization of
                      a single in situ fabricated
                      Nb/$\mathrm{(Bi_{0.15}Sb_{0.85})_2Te_3}$ nano interface. The
                      resulting high interface transparency is apparent by a zero
                      bias conductance increase by a factor of 1.7. Furthermore,
                      we present a comprehensive differential conductance analysis
                      of our single in situ interface for various magnetic fields,
                      temperatures and gate voltages. Additionally, density
                      functional theory calculations of the
                      superconductor/topological insulator interface are performed
                      in order to explain the peak-like shape of our differential
                      conductance spectra and the origin of the observed smearing
                      of conductance features.},
      keywords     = {Mesoscale and Nanoscale Physics (cond-mat.mes-hall) (Other)
                      / FOS: Physical sciences (Other)},
      cin          = {IAS-1 / PGI-1 / PGI-9 / PGI-6 / JARA-FIT},
      cid          = {I:(DE-Juel1)IAS-1-20090406 / I:(DE-Juel1)PGI-1-20110106 /
                      I:(DE-Juel1)PGI-9-20110106 / I:(DE-Juel1)PGI-6-20110106 /
                      I:(DE-Juel1)VDB881},
      pnm          = {5211 - Topological Matter (POF4-521) / DFG project
                      390534769 - EXC 2004: Materie und Licht für
                      Quanteninformation (ML4Q) (390534769)},
      pid          = {G:(DE-HGF)POF4-5211 / G:(GEPRIS)390534769},
      typ          = {PUB:(DE-HGF)25},
      doi          = {10.48550/ARXIV.2312.07325},
      url          = {https://juser.fz-juelich.de/record/1019942},
}