Hauptseite > Publikationsdatenbank > Identification and thermal healing of focused ion beam-induced defects in GaN using off-axis electron holography > print

001     1021074
005     20250204113750.0
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100 1 _ |a Ji, K.
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245 _ _ |a Identification and thermal healing of focused ion beam-induced defects in GaN using off-axis electron holography
260 _ _ |a Bristol
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536 _ _ |a 5353 - Understanding the Structural and Functional Behavior of Solid State Systems (POF4-535)
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700 1 _ |a Schnedler, M.
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700 1 _ |a Lan, Q.
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700 1 _ |a Zheng, F.
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700 1 _ |a Wang, Yaqing Xy
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700 1 _ |a Lu, Y.
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700 1 _ |a Eisele, H.
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700 1 _ |a Carlin, J.-F.
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700 1 _ |a Butté, R.
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700 1 _ |a Grandjean, N.
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700 1 _ |a Dunin-Borkowski, R. E.
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700 1 _ |a Ebert, Ph.
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773 _ _ |a 10.35848/1882-0786/ad163d
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