TY  - JOUR
AU  - Chen, Yingzhen
AU  - Wippermann, Klaus
AU  - Rodenbücher, Christian
AU  - Suo, Yanpeng
AU  - Korte, Carsten
TI  - Impedance Analysis of Capacitive and Faradaic Processes in the Pt/[Dema][TfO] Interface
JO  - ACS applied materials & interfaces
VL  - 16
IS  - 4
SN  - 1944-8244
CY  - Washington, DC
PB  - Soc.
M1  - FZJ-2024-01493
SP  - 5278 - 5285
PY  - 2024
LB  - PUB:(DE-HGF)16
C6  - 38247120
UR  - <Go to ISI:>//WOS:001155534100001
DO  - DOI:10.1021/acsami.3c15465
UR  - https://juser.fz-juelich.de/record/1022503
ER  -