%0 Thesis
%A Lalandec-Robert, Hoelen Laurence
%T Quantitative atomic-level investigation of solid materials through multidimensional electron diffraction measurements
%V 277
%I RWTH Aachen
%V Dissertation
%C Jülich
%M FZJ-2024-01717
%@ 978-3-95806-735-6
%B Schriften des Forschungszentrums Jülich Reihe Schlüsseltechnologien / Key Technologies
%P 152
%D 2024
%Z Dissertation, RWTH Aachen, 2023
%X The recording of a detailed diffraction pattern, as a function of scan position, was enabled in scanning transmission electron microscopy (STEM), thus giving rise to momentum-resolved STEM (MR-STEM). Whereas this technique provides a new framework for atomically-resolved quantitative analysis based on low-angle scattering, it also offers an opportunity to investigate single contributions to the intensity distribution in reciprocal space.
%F PUB:(DE-HGF)3 ; PUB:(DE-HGF)11
%9 BookDissertation / PhD Thesis
%R 10.34734/FZJ-2024-01717
%U https://juser.fz-juelich.de/record/1023485