001023485 001__ 1023485
001023485 005__ 20241209210458.0
001023485 0247_ $$2datacite_doi$$a10.34734/FZJ-2024-01717
001023485 0247_ $$2URN$$aurn:nbn:de:0001-20241209132519822-8752401-7
001023485 020__ $$a978-3-95806-735-6
001023485 037__ $$aFZJ-2024-01717
001023485 041__ $$aEnglish
001023485 1001_ $$0P:(DE-HGF)0$$aLalandec-Robert, Hoelen Laurence$$b0$$eCorresponding author
001023485 245__ $$aQuantitative atomic-level investigation of solid materials through multidimensional electron diffraction measurements$$f- 2022-12-31
001023485 260__ $$aJülich$$bForschungszentrum Jülich GmbH Zentralbibliothek, Verlag$$c2024
001023485 300__ $$a152
001023485 3367_ $$2DataCite$$aOutput Types/Dissertation
001023485 3367_ $$0PUB:(DE-HGF)3$$2PUB:(DE-HGF)$$aBook$$mbook
001023485 3367_ $$2ORCID$$aDISSERTATION
001023485 3367_ $$2BibTeX$$aPHDTHESIS
001023485 3367_ $$02$$2EndNote$$aThesis
001023485 3367_ $$0PUB:(DE-HGF)11$$2PUB:(DE-HGF)$$aDissertation / PhD Thesis$$bphd$$mphd$$s1711439746_4764
001023485 3367_ $$2DRIVER$$adoctoralThesis
001023485 4900_ $$aSchriften des Forschungszentrums Jülich Reihe Schlüsseltechnologien / Key Technologies$$v277
001023485 502__ $$aDissertation, RWTH Aachen, 2023$$bDissertation$$cRWTH Aachen$$d2023$$o2023-05-26
001023485 520__ $$aThe recording of a detailed diffraction pattern, as a function of scan position, was enabled in scanning transmission electron microscopy (STEM), thus giving rise to momentum-resolved STEM (MR-STEM). Whereas this technique provides a new framework for atomically-resolved quantitative analysis based on low-angle scattering, it also offers an opportunity to investigate single contributions to the intensity distribution in reciprocal space.
001023485 536__ $$0G:(DE-HGF)POF4-5351$$a5351 - Platform for Correlative, In Situ and Operando Characterization (POF4-535)$$cPOF4-535$$fPOF IV$$x0
001023485 536__ $$0G:(DE-HGF)VH-NG-1317$$amoreSTEM - Momentum-resolved Scanning Transmission Electron Microscopy (VH-NG-1317)$$cVH-NG-1317$$x1
001023485 8564_ $$uhttps://juser.fz-juelich.de/record/1023485/files/Schluesseltech_277.pdf$$yOpenAccess
001023485 8564_ $$uhttps://juser.fz-juelich.de/record/1023485/files/Schluesseltech_277.gif?subformat=icon$$xicon$$yOpenAccess
001023485 8564_ $$uhttps://juser.fz-juelich.de/record/1023485/files/Schluesseltech_277.jpg?subformat=icon-1440$$xicon-1440$$yOpenAccess
001023485 8564_ $$uhttps://juser.fz-juelich.de/record/1023485/files/Schluesseltech_277.jpg?subformat=icon-180$$xicon-180$$yOpenAccess
001023485 8564_ $$uhttps://juser.fz-juelich.de/record/1023485/files/Schluesseltech_277.jpg?subformat=icon-640$$xicon-640$$yOpenAccess
001023485 909CO $$ooai:juser.fz-juelich.de:1023485$$pVDB$$pdriver$$purn$$popen_access$$popenaire$$pdnbdelivery
001023485 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
001023485 915__ $$0LIC:(DE-HGF)CCBY4$$2HGFVOC$$aCreative Commons Attribution CC BY 4.0
001023485 9141_ $$y2024
001023485 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-HGF)0$$aForschungszentrum Jülich$$b0$$kFZJ
001023485 9131_ $$0G:(DE-HGF)POF4-535$$1G:(DE-HGF)POF4-530$$2G:(DE-HGF)POF4-500$$3G:(DE-HGF)POF4$$4G:(DE-HGF)POF$$9G:(DE-HGF)POF4-5351$$aDE-HGF$$bKey Technologies$$lMaterials Systems Engineering$$vMaterials Information Discovery$$x0
001023485 920__ $$lyes
001023485 9201_ $$0I:(DE-Juel1)ER-C-1-20170209$$kER-C-1$$lPhysik Nanoskaliger Systeme$$x0
001023485 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x1
001023485 9801_ $$aFullTexts
001023485 980__ $$aphd
001023485 980__ $$aVDB
001023485 980__ $$aUNRESTRICTED
001023485 980__ $$abook
001023485 980__ $$aI:(DE-Juel1)ER-C-1-20170209
001023485 980__ $$aI:(DE-Juel1)PGI-5-20110106
001023485 981__ $$aI:(DE-Juel1)ER-C-1-20170209