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001     1023485
005     20241209210458.0
020 _ _ |a 978-3-95806-735-6
024 7 _ |2 datacite_doi
|a 10.34734/FZJ-2024-01717
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037 _ _ |a FZJ-2024-01717
041 _ _ |a English
100 1 _ |0 P:(DE-HGF)0
|a Lalandec-Robert, Hoelen Laurence
|b 0
|e Corresponding author
245 _ _ |a Quantitative atomic-level investigation of solid materials through multidimensional electron diffraction measurements
|f - 2022-12-31
260 _ _ |a Jülich
|b Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag
|c 2024
300 _ _ |a 152
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490 0 _ |a Schriften des Forschungszentrums Jülich Reihe Schlüsseltechnologien / Key Technologies
|v 277
502 _ _ |a Dissertation, RWTH Aachen, 2023
|b Dissertation
|c RWTH Aachen
|d 2023
|o 2023-05-26
520 _ _ |a The recording of a detailed diffraction pattern, as a function of scan position, was enabled in scanning transmission electron microscopy (STEM), thus giving rise to momentum-resolved STEM (MR-STEM). Whereas this technique provides a new framework for atomically-resolved quantitative analysis based on low-angle scattering, it also offers an opportunity to investigate single contributions to the intensity distribution in reciprocal space.
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536 _ _ |0 G:(DE-HGF)VH-NG-1317
|a moreSTEM - Momentum-resolved Scanning Transmission Electron Microscopy (VH-NG-1317)
|c VH-NG-1317
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