%0 Journal Article
%A Nofal, Suheir
%A Pieters, Bart
%A Hülsbeck, Markus
%A Zahren, Christoph
%A Gerber, Andreas
%A Rau, Uwe
%T A direct measure of positive feedback loop-gain due to reverse bias damage in thin-film solar cells using lock-in thermography
%J EPJ Photovoltaics
%V 14
%@ 2105-0716
%C Les Ulis
%I EDP Sciences
%M FZJ-2024-02136
%P 3 -
%D 2023
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000910540600002
%R 10.1051/epjpv/2022030
%U https://juser.fz-juelich.de/record/1024387