TY  - JOUR
AU  - Nofal, Suheir
AU  - Pieters, Bart
AU  - Hülsbeck, Markus
AU  - Zahren, Christoph
AU  - Gerber, Andreas
AU  - Rau, Uwe
TI  - A direct measure of positive feedback loop-gain due to reverse bias damage in thin-film solar cells using lock-in thermography
JO  - EPJ Photovoltaics
VL  - 14
SN  - 2105-0716
CY  - Les Ulis
PB  - EDP Sciences
M1  - FZJ-2024-02136
SP  - 3 -
PY  - 2023
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000910540600002
DO  - DOI:10.1051/epjpv/2022030
UR  - https://juser.fz-juelich.de/record/1024387
ER  -