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@ARTICLE{Nofal:1024387,
author = {Nofal, Suheir and Pieters, Bart and Hülsbeck, Markus and
Zahren, Christoph and Gerber, Andreas and Rau, Uwe},
title = {{A} direct measure of positive feedback loop-gain due to
reverse bias damage in thin-film solar cells using lock-in
thermography},
journal = {EPJ Photovoltaics},
volume = {14},
issn = {2105-0716},
address = {Les Ulis},
publisher = {EDP Sciences},
reportid = {FZJ-2024-02136},
pages = {3 -},
year = {2023},
cin = {IEK-5},
ddc = {670},
cid = {I:(DE-Juel1)IEK-5-20101013},
pnm = {1215 - Simulations, Theory, Optics, and Analytics (STOA)
(POF4-121)},
pid = {G:(DE-HGF)POF4-1215},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000910540600002},
doi = {10.1051/epjpv/2022030},
url = {https://juser.fz-juelich.de/record/1024387},
}