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001024782 1001_ $$0P:(DE-HGF)0$$aMulder, Liesbeth$$b0
001024782 245__ $$aEnhancement of the Surface Morphology of (Bi0.4Sb0.6)2Te3 Thin Films by In Situ Thermal Annealing
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001024782 520__ $$aThe study of the exotic properties of the surface states of topological insulators requires defect-free and smooth surfaces. This work aims to study the enhancement of the surface morphology of optimally doped, high-crystalline (Bi0.4Sb0.6)2Te3 films deposited by molecular beam epitaxy on Al2O3 (001) substrates. Atomic force microscopy shows that by employing an in situ thermal post anneal, the surface roughness is reduced significantly, and transmission electron microscopy reveals that structural defects are diminished substantially. Thence, these films provide a great platform for the research on the thickness-dependent properties of topological insulators.
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001024782 7001_ $$0P:(DE-HGF)0$$avan de Glind, Hanne$$b1
001024782 7001_ $$0P:(DE-HGF)0$$aBrinkman, Alexander$$b2
001024782 7001_ $$0P:(DE-Juel1)188576$$aConcepción, Omar$$b3$$eCorresponding author
001024782 773__ $$0PERI:(DE-600)2662255-5$$a10.3390/nano13040763$$gVol. 13, no. 4, p. 763 -$$n4$$p763 -$$tNanomaterials$$v13$$x2079-4991$$y2023
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