TY  - JOUR
AU  - Mulder, Liesbeth
AU  - van de Glind, Hanne
AU  - Brinkman, Alexander
AU  - Concepción, Omar
TI  - Enhancement of the Surface Morphology of (Bi0.4Sb0.6)2Te3 Thin Films by In Situ Thermal Annealing
JO  - Nanomaterials
VL  - 13
IS  - 4
SN  - 2079-4991
CY  - Basel
PB  - MDPI
M1  - FZJ-2024-02448
SP  - 763 -
PY  - 2023
AB  - The study of the exotic properties of the surface states of topological insulators requires defect-free and smooth surfaces. This work aims to study the enhancement of the surface morphology of optimally doped, high-crystalline (Bi0.4Sb0.6)2Te3 films deposited by molecular beam epitaxy on Al2O3 (001) substrates. Atomic force microscopy shows that by employing an in situ thermal post anneal, the surface roughness is reduced significantly, and transmission electron microscopy reveals that structural defects are diminished substantially. Thence, these films provide a great platform for the research on the thickness-dependent properties of topological insulators.
LB  - PUB:(DE-HGF)16
C6  - 36839131
UR  - <Go to ISI:>//WOS:000940081700001
DO  - DOI:10.3390/nano13040763
UR  - https://juser.fz-juelich.de/record/1024782
ER  -