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@ARTICLE{Mulder:1024782,
      author       = {Mulder, Liesbeth and van de Glind, Hanne and Brinkman,
                      Alexander and Concepción, Omar},
      title        = {{E}nhancement of the {S}urface {M}orphology of
                      ({B}i0.4{S}b0.6)2{T}e3 {T}hin {F}ilms by {I}n {S}itu
                      {T}hermal {A}nnealing},
      journal      = {Nanomaterials},
      volume       = {13},
      number       = {4},
      issn         = {2079-4991},
      address      = {Basel},
      publisher    = {MDPI},
      reportid     = {FZJ-2024-02448},
      pages        = {763 -},
      year         = {2023},
      abstract     = {The study of the exotic properties of the surface states of
                      topological insulators requires defect-free and smooth
                      surfaces. This work aims to study the enhancement of the
                      surface morphology of optimally doped, high-crystalline
                      (Bi0.4Sb0.6)2Te3 films deposited by molecular beam epitaxy
                      on Al2O3 (001) substrates. Atomic force microscopy shows
                      that by employing an in situ thermal post anneal, the
                      surface roughness is reduced significantly, and transmission
                      electron microscopy reveals that structural defects are
                      diminished substantially. Thence, these films provide a
                      great platform for the research on the thickness-dependent
                      properties of topological insulators.},
      cin          = {PGI-9},
      ddc          = {540},
      cid          = {I:(DE-Juel1)PGI-9-20110106},
      pnm          = {5234 - Emerging NC Architectures (POF4-523)},
      pid          = {G:(DE-HGF)POF4-5234},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {36839131},
      UT           = {WOS:000940081700001},
      doi          = {10.3390/nano13040763},
      url          = {https://juser.fz-juelich.de/record/1024782},
}