TY  - JOUR
AU  - Liu, Y. S.
AU  - Zhang, C.
AU  - Zhang, C. W.
AU  - Shi, Y. G.
AU  - Hu, T.
AU  - Schneider, C. M.
AU  - Hou, Xiao
TI  - The vertical longitudinal magnetoresistance in a van der Waals thin film of WTe2
JO  - Applied physics letters
VL  - 122
IS  - 25
SN  - 0003-6951
CY  - Melville, NY
PB  - American Inst. of Physics
M1  - FZJ-2024-02555
SP  - 253101
PY  - 2023
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001015340700024
DO  - DOI:10.1063/5.0151240
UR  - https://juser.fz-juelich.de/record/1024905
ER  -