TY  - JOUR
AU  - Murphy, Gabriel L.
AU  - Svitlyk, Volodymyr
AU  - Henkes, Maximilian
AU  - Shirokiy, Daniil
AU  - Hennig, Christoph
AU  - Kegler, Philip
AU  - Bosbach, Dirk
AU  - Bukaemskiy, Andrey
TI  - The lattice contraction of UO2 from Cr doping as determined via high resolution synchrotron X-ray powder diffraction
JO  - Journal of nuclear materials
VL  - 595
SN  - 0022-3115
CY  - Amsterdam [u.a.]
PB  - Elsevier Science
M1  - FZJ-2024-03615
SP  - 155046 -
PY  - 2024
AB  - High resolution synchrotron powder X-ray diffraction analysis of Cr-doped UO2 samples with additions of Cr2O3as 0, 500, 1000, 1500, 2500 to 3500 ppm prepared under sintering conditions of -420 kJ/mol and 1700 ◦C isreported. The lattice dependence from Cr doping is established through the Rietveld refinement method wherethe rate of linear lattice parameter contraction from Cr doping, Δacr, was found to be considerably smaller andmore subtle than previously described. This investigation highlights the need for high resolution and precisespecimen preparation when measuring and interpreting subtle changes to nuclear material crystal structures dueto trace doping.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001223582400001
DO  - DOI:10.1016/j.jnucmat.2024.155046
UR  - https://juser.fz-juelich.de/record/1027062
ER  -