Hauptseite > Publikationsdatenbank > A time-dependent model simulating the degradation in a solid oxide cell stack during 100 kh of operation > RIS |
TY - CONF AU - Yu, Shangzhe AU - Schäfer, Dominik AU - Eichel, Rüdiger-A. TI - A time-dependent model simulating the degradation in a solid oxide cell stack during 100 kh of operation M1 - FZJ-2024-04458 PY - 2024 T2 - European Electrolyser and Fuel Cell Forum CY - 2 Jul 2024 - 5 Jul 2024, Luzern (Switzerland) Y2 - 2 Jul 2024 - 5 Jul 2024 M2 - Luzern, Switzerland LB - PUB:(DE-HGF)6 UR - https://juser.fz-juelich.de/record/1028277 ER -