TY  - JOUR
AU  - Eberst, Alexander
AU  - Xu, Binbin
AU  - Bittkau, Karsten
AU  - Duan, Weiyuan
AU  - Lambertz, Andreas
AU  - Meise, Ansgar
AU  - Heggen, Marc
AU  - Dunin-Borkowski, Rafal E.
AU  - Rau, Uwe
AU  - Ding, Kaining
TI  - Deeper Insight into the Mechanisms Behind Sputter Damage in Silicon Solar Cells Based on the Example of Nanocrystalline Silicon Carbide
JO  - Advanced physics research
VL  - 3
IS  - 9
SN  - 2751-1200
CY  - Weinheim
PB  - Wiley-VCH GmbH
M1  - FZJ-2024-04709
SP  - 2400036
PY  - 2024
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001261412700001
DO  - DOI:10.1002/apxr.202400036
UR  - https://juser.fz-juelich.de/record/1028642
ER  -