% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@INPROCEEDINGS{Liu:1028751,
      author       = {Liu, Y. and Juckel, Martin and Menzler, Norbert H. and
                      Weber, A.},
      title        = {{A}ccelerated {S}tress {T}est and {Q}uantitative {A}nalysis
                      of {D}egradation in {N}ickel/{C}eria {F}uel {E}lectrodes},
      reportid     = {FZJ-2024-04799},
      year         = {2024},
      abstract     = {In targeting lifetimes of 10 years, accelerated stress
                      testing becomes inevitable forensuring the longevity and
                      successful market introduction of SOCs. These
                      elevatedstressors can impact various degradation mechanisms
                      to differing extents and may pushthe cell into unstable
                      operating regimes, resulting in behaviors irrelevant to
                      nominaloperating conditions. Consequently, designing such
                      tests presents a significant challenge.For SOCs aiming for
                      operating temperatures below 600°C, elevated
                      operatingtemperatures are necessary to accelerate aging due
                      to microstructural changes.Accelerated stress tests are
                      tailored for state-of-the-art screen-printed Ni/GDC cermet
                      fuelelectrodes, utilizing symmetrical cells to mitigate the
                      impact of the air electrode. Thesecells operate at
                      temperatures ranging from 600 to 750°C with a high steam
                      content $of50\%.$ Electrode performance over time is
                      monitored using electrochemical impedancespectroscopy.
                      Temporal changes in loss processes are identified through
                      DRT analysis,followed by fitting to an equivalent circuit
                      model. We introduce a quantitative analysismethod and a
                      corresponding aging model for direct comparison between
                      degradationunder different stressors.},
      month         = {Jul},
      date          = {2024-07-02},
      organization  = {16th European SOFC $\&$ SOE Forum,
                       Lucerne (Switzerland), 2 Jul 2024 - 5
                       Jul 2024},
      subtyp        = {After Call},
      cin          = {IMD-2},
      cid          = {I:(DE-Juel1)IMD-2-20101013},
      pnm          = {1231 - Electrochemistry for Hydrogen (POF4-123) / SOFC -
                      Solid Oxide Fuel Cell (SOFC-20140602)},
      pid          = {G:(DE-HGF)POF4-1231 / G:(DE-Juel1)SOFC-20140602},
      typ          = {PUB:(DE-HGF)24},
      url          = {https://juser.fz-juelich.de/record/1028751},
}