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@ARTICLE{CorleyWiciak:1029435,
      author       = {Corley-Wiciak, Cedric and Zoellner, Marvin H. and
                      Corley-Wiciak, Agnieszka A. and Rovaris, Fabrizio and
                      Zatterin, Edoardo and Zaitsev, Ignatii and Sfuncia,
                      Gianfranco and Nicotra, Giuseppe and Spirito, Davide and von
                      den Driesch, Nils and Manganelli, Costanza L. and
                      Marzegalli, Anna and Schulli, Tobias U. and Buca, Dan and
                      Montalenti, Francesco and Capellini, Giovanni and Richter,
                      Carsten},
      title        = {{F}ull {P}icture of {L}attice {D}eformation in a {G}e 1-x
                      {S}n x {M}icro‐{D}isk by 5{D} {X}‐ray {D}iffraction
                      {M}icroscopy},
      journal      = {Small Methods},
      volume       = {8},
      number       = {12},
      issn         = {2366-9608},
      address      = {Weinheim},
      publisher    = {WILEY-VCH Verlag GmbH $\&$ Co. KGaA},
      reportid     = {FZJ-2024-05124},
      pages        = {2400598},
      year         = {2024},
      abstract     = {Lattice strain in crystals can be exploited to effectively
                      tune their physical properties. In microscopic structures,
                      experimental access to the full strain tensor with spatial
                      resolution at the (sub-)micrometer scale is at the same time
                      very interesting and challenging. In this work, how scanning
                      X-ray diffraction microscopy, an emerging model-free method
                      based on synchrotron radiation, can shed light on the
                      complex, anisotropic deformation landscape within three
                      dimensional (3D) microstructures is shown. This technique
                      allows the reconstruction of all lattice parameters within
                      any type of crystal with submicron spatial resolution and
                      requires no sample preparation. Consequently, the local
                      state of deformation can be fully quantified. Exploiting
                      this capability, all components of the strain tensor in a
                      suspended, strained Ge1 − xSnx /Ge microdisk are mapped.
                      Subtle elastic deformations are unambiguously correlated
                      with structural defects, 3D microstructure geometry, and
                      chemical variations, as verified by comparison with
                      complementary electron microscopy and finite element
                      simulations. The methodology described here is applicable to
                      a wide range of fields, from bioengineering to metallurgy
                      and semiconductor research.},
      cin          = {PGI-9 / PGI-10 / JARA-FIT},
      ddc          = {620},
      cid          = {I:(DE-Juel1)PGI-9-20110106 / I:(DE-Juel1)PGI-10-20170113 /
                      $I:(DE-82)080009_20140620$},
      pnm          = {5234 - Emerging NC Architectures (POF4-523) / DFG project
                      G:(GEPRIS)299480227 - SiGeSn Laser für die Silizium
                      Photonik (299480227)},
      pid          = {G:(DE-HGF)POF4-5234 / G:(GEPRIS)299480227},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {39075823},
      UT           = {WOS:001280201100001},
      doi          = {10.1002/smtd.202400598},
      url          = {https://juser.fz-juelich.de/record/1029435},
}