%0 Journal Article
%A Schalenbach, Maximilian
%A Raijmakers, Luc
%A Tempel, Hermann
%A Eichel, Rüdiger-A.
%T How Microstructures, Oxide Layers, and Charge Transfer Reactions Influence Double Layer Capacitances. Part 2: Equivalent Circuit Models
%J Electrochemical science advances
%V 5
%N 1
%@ 2698-5977
%C Weinheim
%I Wiley-VCH Verlag GmbH & Co KGaA
%M FZJ-2024-05264
%P e202400010
%D 2025
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:001283413800001
%R 10.1002/elsa.202400010
%U https://juser.fz-juelich.de/record/1030247