%0 Journal Article
%A Stasner, Pascal
%A Kopperberg, Nils
%A Schnieders, Kristoffer
%A Hennen, Tyler
%A Wiefels, Stefan
%A Menzel, Stephan
%A Waser, Rainer
%A Wouters, Dirk J.
%T Reliability effects of lateral filament confinement by nano-scaling the oxide in memristive devices
%J Nanoscale horizons
%V 9
%N 5
%@ 2055-6756
%C Cambridge
%I Royal Society of Chemistry
%M FZJ-2024-05554
%P 764 - 774
%D 2024
%F PUB:(DE-HGF)16
%9 Journal Article
%$ 38511616
%U <Go to ISI:>//WOS:001188297800001
%R 10.1039/D3NH00520H
%U https://juser.fz-juelich.de/record/1031150