TY  - JOUR
AU  - Stasner, Pascal
AU  - Kopperberg, Nils
AU  - Schnieders, Kristoffer
AU  - Hennen, Tyler
AU  - Wiefels, Stefan
AU  - Menzel, Stephan
AU  - Waser, Rainer
AU  - Wouters, Dirk J.
TI  - Reliability effects of lateral filament confinement by nano-scaling the oxide in memristive devices
JO  - Nanoscale horizons
VL  - 9
IS  - 5
SN  - 2055-6756
CY  - Cambridge
PB  - Royal Society of Chemistry
M1  - FZJ-2024-05554
SP  - 764 - 774
PY  - 2024
LB  - PUB:(DE-HGF)16
C6  - 38511616
UR  - <Go to ISI:>//WOS:001188297800001
DO  - DOI:10.1039/D3NH00520H
UR  - https://juser.fz-juelich.de/record/1031150
ER  -