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Error detection and correction codes for safe in-memory computations
Parrini, L. ; Soliman, T. ; Hettwer, B. ; Borrmann, J. M. ; Singh, S.FZJ* ; Bende, A.FZJ* ; Rana, V.FZJ* ; Merchant, F. ; Wehn, N.
2024
202429th IEEE European Test Symp. 2024, The HagueThe Hague, Netherlands, 20 May 2024 - 24 May 20242024-05-202024-05-24
4 pp. (2024)2024
Contributing Institute(s):
- Elektronische Materialien (PGI-7)
- JARA-FIT (JARA-FIT)
- JARA Institut Green IT (PGI-10)
Research Program(s):
- 5234 - Emerging NC Architectures (POF4-523) (POF4-523)
- BMBF 16ME0398K - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0398K) (BMBF-16ME0398K)
Appears in the scientific report
2024