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| Home > Publications database > Chiral magnetic structures probed by SANS & GISANS |
| Conference Presentation (Invited) | FZJ-2024-06885 |
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2024
Abstract: Chiral magnetic structures in single crystals and thin film structures probed by polarization-analyzedSmall Angle Neutron Scattering (SANS) & Grazing-Incidence-SANS are often connected to complexanalysis procedures and require the development of individual magnetic models. Additionally, precisedata-reduction protocols are needed to distinguish sample scattering from instrumentationaleffects. The more involved the different interactions in one sample system, the more care has tobe taken for a comprehensive understanding as function of, e.g., magnetic field, electric field, temperature,and further parameter sets. The key to a broad understanding then can be given by thecomparison of various analysis methods.Here, I will provide two examples on the complexity of magnetic (GI-)SANS data analysis on differentmaterials: (i) a ferromagnetic/superconducting thin film with temperature dependent chiralmagnetic domain walls, and (ii) a magnetoelectric single crystal with chiral magnetic phases dependingon temperature, magnetic, and electric field. For study (i) we will compare polarization-analyzedGISANS data on Nb/FePd thin films with perpendicular magnetic anisotropy with results from CDXRMS,and evaluate our conclusions together with information gained by Density Functional Theory(DFT) [1]. In study (ii), we present the dependence of magnetic chiral phases occurring in the magnetoelectricsingle crystal Ba2−xSrxMg2Fe12O22 [2] as function of temperature and magnetic field.[1] P. C. Carvalho et al., Nano Lett. 23, 4854−4861 (2023).[2] K. Zhai et al., Nature Communications 8, 519 (2017).
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