%0 Conference Paper
%A Issac, Tom Glint
%A Paul, Godwin
%A Bende, Ankit
%A Dittmann, Regina
%A Rana, Vikas
%T Resilience of Digital and Analog RRAM-Based ML Models to Device Variability: A Comparative Study
%M FZJ-2024-07073
%D 2024
%B 31st IEEE International Conference on Electronics, Circuits and Systems (ICECS). IEEE
%C 18 Nov 2024 - 20 Nov 2024, Nancy (France)
Y2 18 Nov 2024 - 20 Nov 2024
M2 Nancy, France
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/1034284