TY  - CONF
AU  - Issac, Tom Glint
AU  - Paul, Godwin
AU  - Bende, Ankit
AU  - Dittmann, Regina
AU  - Rana, Vikas
TI  - Resilience of Digital and Analog RRAM-Based ML Models to Device Variability: A Comparative Study
M1  - FZJ-2024-07073
PY  - 2024
T2  - 31st IEEE International Conference on Electronics, Circuits and Systems (ICECS). IEEE
CY  - 18 Nov 2024 - 20 Nov 2024, Nancy (France)
Y2  - 18 Nov 2024 - 20 Nov 2024
M2  - Nancy, France
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/1034284
ER  -