Home > Publications database > Scanning probe microscopy studies of nanoscale effects in HfOx-based resistive switching systems
 
Dissertation / PhD Thesis FZJ-2024-07103
http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png
Scanning probe microscopy studies of nanoscale effects in HfOx-based resistive switching systems



2024

120 pp. () = Dissertation, RWTH Aachen, 2024


Note: Dissertation, RWTH Aachen, 2024
Contributing Institute(s):
  1. Elektronische Materialien (PGI-7)
Research Program(s):
  1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)

Appears in the scientific report 2024
Click to display QR Code for this record

The record appears in these collections:
Document types > Theses > Ph.D. Theses
Institute Collections > PGI > PGI-7
Workflow collections > Public records
Publications database
 Record created 2024-12-15, last modified 2024-12-16
Similar records



Rate this document:

Rate this document:
1
2
3
4
5
 
(Not yet reviewed)
JuSER :: Search :: Submit :: Personalize :: Help
Powered by Invenio v1.1.7 | join2_v2508-8-g6303aad
Maintained by juser@fz-juelich.de

Impressum | Data Privacy Policy
This site is also available in the following languages:
Deutsch  English